Sample: aHT07a
2/d (1/nm) d (nm) Plane
5.84 0.34 A(101)
8.80 0.23 R (200)
11.011 0.18 A (200)
12.29 0.16 R (220) /A (211)
14.13 0.14 R (221)
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[TEM image of TiO2/Ag nanofiber aHT07a; inset: electron diffraction from the same sample.]
[TEM image of TiO2/Ag nanofiber aHT07b; inset: electron diffraction from the same sample.]
Similarly, for electron diffraction patterns which are more of a spot-like appearance, the distance between the two corresponding spots from the same k vector will be 2/d. This information about the d-spacings can also be obtained from high-resolution TEM (HR-TEM) imaging. As an example, the d-spacing in the TEM image below corresponds to the distance between two parallel lattice fringes. The parallel lines that you see in the image below are distinct planes of atoms of Ag (silver) arranged in a specific manner to form a single crystal. The Ag nanoparticle in the image below seems to be comprised of about 3 such crystals, called twins.
The types of characterization techniques possible with electron microscopy are many. All these different techniques give us material scientists information about physical structure, chemical composition, crystallinity, phases, distribution, and even 3D reconstruction of nanoscale models.
[This article is also published in the blog, Nano Pulse, here: link.]
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